XRF Analyzer is Quick with Results
Oxford Instruments’ new X-Ray Fluorescence
(XRF) analyzer, the fourth-generation
X-MET5000, is designed to allow
accurate and reliable identification of
multi-element ores. The X-MET5000 can
measure directly on drill cores or the sample
can be prepared for a more accurate
analysis. A user friendly empirical calibration
package allows on-the-spot sample
analysis and the universal fundamental
parameter analysis mode is available for
measurement of ores without known standards.
With results often obtained in less
than 20 seconds, the powerful user programmable
interface enables highly accurate screening for on-site go/no-go decisions. The X-MET5000 is
IP54 (NEMA 3) approved for dust and splash protection, and its
battery operating time extends for a full work day. An optional
bench-top stand enables hands-free operation.
www.oxford-instruments.com
As featured in Womp 08 Vol 5 - www.womp-int.com
